Scanning Electron Microscope (SEM)

The SEM at the Syed Babar Ali School of Science and Engineering is a field-emission machine with promised resolutions of up to 0.8 nm under ideal imaging conditions. The Nova NanoSEM 450 scanning electron microscope (SEM) delivers state-of-the-art imaging and analytical performance in a single, easy-to-use instrument. Specifically designed to streamline operations in laboratory, the Nova NanoSEM enables users the ability to obtain a comprehensive analysis of a wide range of samples.

The electron microscope is quipped with:

• field emission electron microscopy
• energy dispersive X-ray fluorescence
• electron beam lithography

Here is a gallery of micrographs obtained at LUMS.