|Researchers||Usman Javed, final year project|
|Supplementary Materials||Thesis AFM Final 30July 2016 v2|
In this project, we have developed an atomic force microscope (AFM) capable of resolving vertical features of the order of 20 nm over an area of 12 microns square. This is achieved by analyzing the reflection of a laser beam off a cantilever making contact with the surface of a sample placed on a motorized transition stage driven by piezoelectric based nano-positioning actuator. The reflected beam’s position is monitored by a closed loop proportional-integral control system that was specifically designed for this purpose. This AFM is a cost effective solution for a very sensitive instrument that has become essential in today’s research and development in Nanotechnology, Solid State Physics, Microbiology and many other fields of Science and Engineering.